Center for Computing Research
Scalable Analysis and Vis, 01461
The scalable analysis and visualization department specializes in the research and development of capabilities to enable an understanding of large, complex data in direct support of the broader national-security missions of Sandia National Laboratories. We develop state-of-the-art techniques for visualization and predictive analytics through deep expertise and experience in statistical methods, machine learning, data mining, high-performance computing, computational geometry and graphics. Our department also maintains a robust external presence through strategic partnerships with universities, industry, and other national laboratories; and is committed to developing and contributing to open-source technologies.
|Ron A. Oldfield|
Manager, Scalable Analysis and Vis
Sandia National Laboratories
P.O. Box 5800, MS 1327
The Scalable Analysis and Visualization Department is involved with the projects listed below.
- Released VTK-m user's guide, version 1.1
Researchers at Sandia National Laboratories, in collaboration with Kitware Inc., Oak Ridge National Laboratory, Los Alamos National Laboratory, and the university of Oregon, are proud to release VTK-m version 1....
Released VTK-m user's guide, version 1.1
Researchers at Sandia National Laboratories, in collaboration with Kitware Inc., Oak Ridge National Laboratory, Los Alamos National Laboratory, and the university of Oregon, are proud to release VTK-m version 1.1. The VTK-m library provides highly parallel code to execute visualization on many-core processors like GPUs, multi-core CPUs, and other hardware we are likely to see at for Exascale HPC. This release of VTK-m includes critical core features including filter structures and key reduction. Also provided by this release are several new filters including external faces, gradients, clipping, and point merging. Also provided with this release is a comprehensive VTK-m User’s Guide providing detailed instruction and reference for using and editing VTK-m.
Contact: Moreland, Kenneth D. (Ken)